Introducing the 950i family of powerful, versatile, easy-to-use Dielectric Analyzers. With six models to choose from – you can be sure one is just right for your hi-pot or breakdown test requirements.
Forget what you’ve learned about typical high voltage insulation testers – Vitrek has incorporated advanced DSP technology into the new 950i series to bring you the fastest, most capable, feature rich hipot testers available for a surprisingly low price. Vitrek’s new 950i Series combines high output power, with a wide range of AC & DC voltage outputs and extremely low leakage current measurement. Then we added a 4-wire milli-ohmmeter with dynamic range up to 100K ohms and an overlapping Tera-ohm class Insulation Resistance function. Top that off with an available 40 Amp Ground Bond capability and you’re just beginning to get a feel for what the new Vitrek 950i Series Hipot Testers can do for you. Choose form the 951i, 952i, 953i, 954i, 955i or the Ground Bond only 959i. * International prices are approximately 5% higher than those listed below.
Features & Benefits:
- Highest Level of Operator Safety - features include: HSSD™ High Speed Solid-State load Discharge -to remove exposed voltages faster than passive resistor designs, SFI™ Safety Fault Interrupt - shuts down output in as little as 50uS from detection, TLSS™ Test Lead Safety Sense - continuously verifies that test leads are properly connected prior to and during HV and continuity testing, Recessed start switch prevents inadvertent actuation, Dual Channel current measurement detects earth leakage faults
- High Power Output- means better drive capability and increased test throughout. With up to 50mA of current sourcing for AC & DC hipot the 950i Series gets heavy duty jobs done fast - available 200mA drive tackles even tougher sourcing requirements
- Wide Range of built-in Voltage Capabilities - starting at 6KV AC/DC extending to 10KVAC and 11KVDC or up to 30KV RMS AC with external option
- The Fastest Hipot Testers available - Thanks to our Dual Coldfire® microprocessors combined with Dual DSPs to provide Ramp rates up to 50KV/second, dwell times as low as 20mS and overall test times as fast as 3mS in optional Flash mode
- Expansive Test Sequence Memory holds up to 100 tests with up to 100 steps per test. Tests can be selected via front panel, RS232 or Digital I/O or with optional GPIB/Ethernet
- Ground Bond Test Capability available in three models with output currents from 100mA to 40Amps RMS and test times from 20mS to 1000 seconds or longer
- 4-Wire Milli-Ohmmeter Function provides fast, accurate 5 digit resistance measurements with resolution down to 100µΩ and range up to 100K ohms
- Built-in Phase Angle Measurement - allows the measurement and display of both resistive (in-phase) leakage current and reactive (out-of-phase) leakage current caused by capacitive coupling
- Multi-Dwell Functionality - permits dwells at different voltage levels without having to return to zero between test steps - dramatically simplifying advanced analysis of dielectric properties
- Ramp High/Dwell Low Current Limits - permits the user to set separate limits for the ramp and dwell providing faster ramp times and lower leakage test limits
- LAN/Ethernet, USB Print, RS232, Digital I/O & Scanner Control - All Standard Interfaces - Provides the highest level of test automation. Full serial control and DI/O with remote start/stop, safety fault interrupt, test select & more
- High Voltage Scanner Control - up to 256 point switching capability can be handled via the standard VICL auxiliary control port. Available scanners can route voltages up to 15KV and currents up to 40A for multi-point hipot and ground bond test requirements
- Dual Dimensional / Test Specific / Broadband Arc Detection. Where lesser testers allow you to set a single, global, amplitude only arc limit - the technologically advanced 950i Series utilizes time & amplitude based arc limits and uniquely applies them to each desired test
- Hard Copy Test Report, Ethernet and GPIB all available via optional interface card. Host USB printer control port generates comprehensive test report at the touch of a button, LAN and GPIB ports offer robust industrial interface formats
- Pico-Amp Leakage Measurement insures that even the lowest leakage current levels are accurately detected and tera-ohm range IR readings are stable and precise
- Test Specific Fixture & Cable Compensation - Automatically calibrate out offset errors caused by lead resistance, fixture capacitance and leakage. Compensation constants are stored with each test and can be updated with the touch of a button
- Multi-Mode IR - Insulation Resistance values up to one Tera-ohm can be obtained with precision in your choice of 3 IR test modes - end test on timer, end test on pass reading or fail reading. Choose either AC IR or DC IR to suit your measurement requirement
- Continuously Variable IR Test Voltage - Unlike most IR testers which limit you to 3 or 4 discrete test voltages, the 950i Series allows you to select the test voltage you need. Starting as low as 2V all the way to 6.5KV or 11KV in the higher voltage models
- Capacitance Test Modes - For AC & DC hipot and IR provide tightly controlled charge and discharge profiles for superior results on critical solar panel tests and other highly capacitive loads
- Light Weight Switching Power Supply Design - Reduces component count and internal heat rise while improving overall reliability. Starting at only 18 lbs, 950i Series portability is a snap
- 400Hz AC Voltage Withstand Testing provides aviation frequency specific test results for a more effective analysis of dielectric properties on avionic components
- Solar Panel Testing Simplified - Designed with PV testing in mind, the 950i Series uses pico-amp resolution to detect minute defects in solar cells while its HSSD High Speed Solid Discharge provides the industry's safest and fastest throughput rates
- 3 Year Extended Warranty* - Built-in reliability you can count on for years to come
- Safety Tested per EN 61010-1. EMC compliant to EN 61326-1
DC Dielectric Tests
(DCW, DCIR, DCez, DCCAP)
DC Output Voltage: 2V to 6500V (951i & 952i)
2V to 11000V (953i,954i & 955i)
Resolution: 0.1V up to 999.9V, 1V above
Accuracy: 0.25% + 0.5V ( 1 year 23°C ± 3°)
DC Current Sourcing: 50mA max, 25mA above 6000V (951i & 952i)
30mA max, 20mA above 6000V, 10mA above
7500V, 5mA above 9000V (953i, 954i, 955i)
Ramp Time: 0.01 to 9999sec, 0.01sec resolution
or 0.1 to 50000V/sec, 0.1V/sec resolution
Dwell Time: 0.02 to 9999 seconds or user terminated, 0.01sec
resolution
Discharge: 25mA max in solid-state constant current discharge mode,
selectable same as ramp rate or ramp to next level if next
step is DCW, DCez or DCIR
DC Leakage Current: Measurement Range: 0 to +/-200mA,
Resolution: 4 digits (9999 counts) down to 100pico-amp
Accuracy: 0.25% + 0.5nA + ½ digit ( 1 year 23°C ± 3°)
Min & Max Current limits: Selectable for Ramp and Dwell 100 pico-amps and up
Measurement Period: 1 power line cycle (50/60Hz)
Insulation Resistance (IR): Test modes include: End on pass reading, end
on fail or end on dwell timer
